Logic kỹ thuật số thử nghiệm và mô phỏng P9
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Numerous ATPG algorithms and heuristics have been developed over the years to test digital logic circuits. Some of these methods can trace their origins back to the very beginnings of the digital logic era. Unfortunately, they have proven inadequate to the task. Despite many novel and interesting schemes designed to attack test problems in digital circuits, circuit complexity and the sheer number of logic devices on a die continue to outstrip the test schemes that have been developed, and there does not appear to be an end in sight, as levels of circuit integration continue to grow unabated. New methods...
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