This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system.
This book compiles recent studies on interferometry and its applications in science and
technology. It is intended as an up-to-date reference of theoretical and experimental
aspects of interferometry and their applications.
The book is divided in two sections. The first one is an overview of different
interferometry techniques and their general applications. Chapter 1 is concentrated
on the classical field interferometry. This chapter describes and explains the
structures of different type of fiber interferometers, and the standard methods for
An overview of PTB’s activities in the field of dimensional nanometrology using
scanning probe microscopes (SPMs) is presented. The chapter is divided into two
parts: the development of (1) high-resolution probing systems and (2) complete
SPM metrology systems. The subject of SPM-probing system design comprises,
among other things, the concept of the “sensor objective” to combine conventional
microscopy with scanning probe techniques.
All optical phenomena experience interference effects at some level. Even light
from an incandescent light bulb has partial coherence that can lead to constructive
or destructive interference when multiple light paths are combined at a detector.
The ubiquitous nature of interference underlies many phenomena and techniques in
biological optics. This chapter lays the foundation for interferometry applied to
biology and medicine.
In Chapters 3 and 6–9 we have given a description of classical interferometry, holographic interferometry, moir´ , speckle and photoelasticity. The outcome of all these techniques is e a set of fringes called interferograms. For many years, the analysis of these interferograms has been a matter of manually locating the positions and numbering of the fringes. With the development and decreasing cost of digital image processing equipment, a lot of effort has been made into what is termed digital fringe pattern measurement techniques....