Scanning probe microscopy

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  • Nanotips have been in increasing demand over the last two decades, owing to their crucial role in the main nanotechnology instruments, like scanning probe microscopes and scanning electron and transmission microscopes. Well-defined ultrasharp tips have also attracted a growing interest in molecular electronics, as they are needed for fabrication and characterization of molecular structures. In this chapter we present several methods that have been explored so far for fabricating such ultrasharp tips, with an emphasis on the most recent technique.

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  • Progress in modern science is impossible without reliable tools for characterization of structural, physical, and chemical properties of materials and devices at the micro-, nano-, and atomic scale levels. While structural information can be obtained by such established techniques as scanning and transmission electron microscopy, high-resolution examination of local electronic structure, electric potential and chemical functionality is a much more daunting problem.

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  • Tuyển tập báo cáo các nghiên cứu khoa học quốc tế ngành hóa học dành cho các bạn yêu hóa học tham khảo đề tài: Combining scanning probe microscopy and x-ray spectroscopy

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  • 495 Nanotribol Part C Nanotribology and Nanomechanics 17 Micro/Nanotribology and Materials Characterization Studies Using Scanning Probe Microscopy Bharat Bhushan, Columbus, USA 18 Surface Forces and Nanorheology of Molecularly Thin Films Marina Ruths, Åbo, Finland Alan D. Berman, Los Angeles, USA Jacob N. Israelachvili, Santa Barbara, USA 19 Scanning Probe Studies of Nanoscale Adhesion Between Solids in the Presence of Liquids and Monolayer Films Robert W. Carpick, Madison, USA James D.

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  • The invention of scanning tunneling microscope (STM) by Binnig and his colleagues in 1982 opened up the possibility of imaging material surfaces with spatial resolution much superior to the conventional microscopy techniques. The STM is the first instrument capable of directly obtaining three-dimensional images of solid surfaces with atomic resolution. Even though STM is capable of achieving atomic resolution, it can only be used on electrical conductors. This limitation has led to the invention of atomic force microscope (AFM) by Binnig and his co-workers in 1986.

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  • Tuyển tập báo cáo các nghiên cứu khoa học quốc tế ngành hóa học dành cho các bạn yêu hóa học tham khảo đề tài: Scanning Probe Microscopy on heterogeneous CaCu3Ti4O12 thin films

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  • Tuyển tập báo cáo các nghiên cứu khoa học quốc tế ngành hóa học dành cho các bạn yêu hóa học tham khảo đề tài: Layer-dependent nanoscale electrical properties of graphene studied by conductive scanning probe microscopy

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  • Advances in nanotechnology over the past decade have made scanning electron microscopy (SEM) an indispensable and powerful tool for analyzing and constructing new nanomaterials. Development of nanomaterials requires advanced techniques and skills to attain higher quality images, understand nanostructures, and improve synthesis strategies. A number of advancements in SEM such as field emission guns, electron back scatter detection (EBSD), and X-ray element mapping have improved nanomaterials analysis.

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  • Microscopic and imaging techniques: – Optical microscopy – Confocal microscopy – Electron microscopy (SEM and TEM, related methods) – Scanning probe microscopy (STM and AFM, related methods) Surface spectrometric techniques: – X-ray fluorescence (from electron microscopy) – Auger electron spectrometry – X-ray photoelectron spectrometry (XPS/UPS/ESCA)

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  • Tuyển tập báo cáo các nghiên cứu khoa học quốc tế ngành hóa học dành cho các bạn yêu hóa học tham khảo đề tài: Scanned Probe Oxidation on p-GaAs(100) Surface with an Atomic Force Microscopy

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  • Surface science was revolutionized in 1982 by the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer who received the Nobel prize only 4 years later in 1986 [1]. Shortly after the invention, the first images showing atomic resolution on a Si(111) 77 surface were obtained. As this allowed real space imaging of atomic structure, it gave a new turn on nanotechnology research. By means of its working principle, namely the quantum mechanical tunneling current, the STM is inherently limited to the study of conducting surfaces.

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  • In a January 2000 speech at the California Institute of Technology, former PresidentW. J. Clinton talked about the exciting promise of “nanotechnology” and the importance of expanding research in nanoscale science and engineering and in the physical sciences, more broadly. Later that month, he announced in his State of the Union Address an ambitious $ 497 million federal, multi-agency national nanotechnology initiative (NNI) in the fiscal year 2001 budget; and he made the NNI a top science and technology priority within a budget that emphasized increased investment in U.S.

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  • An overview of PTB’s activities in the field of dimensional nanometrology using scanning probe microscopes (SPMs) is presented. The chapter is divided into two parts: the development of (1) high-resolution probing systems and (2) complete SPM metrology systems. The subject of SPM-probing system design comprises, among other things, the concept of the “sensor objective” to combine conventional microscopy with scanning probe techniques.

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