Xem 1-9 trên 9 kết quả Use afm
  • Highly experienced physicians and biologists clearly explain the basic technical knowledge needed to use AFM and demonstrate its multifarious uses in biomedicine and the life sciences. The applications range widely from morphostructural analyses of cellular structures, to the investigation of subcellular structures, to functional investigations, and reveal a powerful new way of looking at biological samples.

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  • Tuyển tập các báo cáo nghiên cứu về hóa học được đăng trên tạp chí hóa hoc quốc tế đề tài : Nano-structure fabrication of GaAs using AFM tip-induced local oxidation method: different doping types and plane orientations

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  • This is the first book to cover the history, structure, and application of atomic force microscopy in cell biology. Presented in the clear, well-illustrated style of the Methods in Cell Biology series, it introduces the atomic force microscope (AFM) to its readers and enables them to tap the power and scope of this technology to further their own research. A practical laboratory guide for use of the atomic force and photonic force microscopes, it provides updated technology and methods in force spectroscopy.

    pdf430p chipmoon 19-07-2012 57 22   Download

  • Tuyển tập báo cáo các nghiên cứu khoa học quốc tế ngành y học dành cho các bạn tham khảo đề tài: Cellular transfer and AFM imaging of cancer cells using Bioimprint

    pdf10p toshiba25 08-12-2011 14 2   Download

  • Bhushan, B. “Microscratching/Microwear, Nanofabrication/Nanomachining...” Handbook of Micro/Nanotribology. Ed. Bharat Bhushan Boca Raton: CRC Press LLC, 1999 © 1999 by CRC Press LLC Microscratching/ Microwear, Nanofabrication/ Nanomachining, and Nano/Picoindentation Using Atomic Force Microscopy Bharat Bhushan 7.1 7.2 7.3 7.4 7.5 7.6 Introduction Experimental Techniques AFM for Microscratching/Microwear and Nanoindentation • Nano/Picoindenter 7 Microscratching/Microwear Studies Nanofabrication/Nanomachining Studies Nano/Picoindentation Closure References 7.

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  • With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique, useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample, and permit a three dimensional investigation of the surface.

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  • Ahn et al. Nanoscale Research Letters 2011, 6:235 http://www.nanoscalereslett.com/content/6/1/235 NANO EXPRESS Open Access Crystallographic plane-orientation dependent atomic force microscopy-based local oxidation of silicon carbide Jung-Joon Ahn1, Yeong-Deuk Jo1, Sang-Cheol Kim2, Ji-Hoon Lee2, Sang-Mo Koo1* Abstract The effect of crystalline plane orientations of Silicon carbide (SiC) (a-, m-, and c-planes) on the local oxidation on 4H-SiC using atomic force microscopy (AFM) was investigated.

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  • The invention of scanning tunneling microscope (STM) by Binnig and his colleagues in 1982 opened up the possibility of imaging material surfaces with spatial resolution much superior to the conventional microscopy techniques. The STM is the first instrument capable of directly obtaining three-dimensional images of solid surfaces with atomic resolution. Even though STM is capable of achieving atomic resolution, it can only be used on electrical conductors. This limitation has led to the invention of atomic force microscope (AFM) by Binnig and his co-workers in 1986.

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  • Surface science was revolutionized in 1982 by the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer who received the Nobel prize only 4 years later in 1986 [1]. Shortly after the invention, the first images showing atomic resolution on a Si(111) 77 surface were obtained. As this allowed real space imaging of atomic structure, it gave a new turn on nanotechnology research. By means of its working principle, namely the quantum mechanical tunneling current, the STM is inherently limited to the study of conducting surfaces.

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