Sram cell capacitance.

Soft error is a great concern for microelectronics circuits today. With the advanced development i n CMOS technologies, VLSI circuits are becoming more sensitive to external noise sources, especially radiation particle strikes, which are the cause of soft error. Soft errors are random and do not cause the permanent failure. However, it causes the corruption of stored information, which could turn to the failure in functionality of the circuits.

89p conchokon 24-09-2012 93 11   Download