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Three dimensional characterisation of chromatography bead internal structure using X-ray computed tomography and focused ion beam microscopy

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X-ray computed tomography (CT) and focused ion beam (FIB) microscopy were used to generate three dimensional representations of chromatography beads for quantitative analysis of important physical characteristics including tortuosity factor.

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Nội dung Text: Three dimensional characterisation of chromatography bead internal structure using X-ray computed tomography and focused ion beam microscopy

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