Focused ion beam microscopy

Ebook "Scanning electron microscopy and X-ray microanalysis (Fourth edition)" provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams.

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Scanning electron microscopy (SEM) is a powerful tool for visualising reservoir pore and grain framework systems which (SEM) provides qualitative information about pore geometry through direct observation of a rock or a pore cast of the rock. This aids in understanding reservoir productivity capabilities.

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X-ray computed tomography (CT) and focused ion beam (FIB) microscopy were used to generate three dimensional representations of chromatography beads for quantitative analysis of important physical characteristics including tortuosity factor.

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In order to investigate how the microstructure of fuel/matrix-interaction (FMI) layers change during irradiation, different U–7Mo dispersion fuel plates have been irradiated to high fission density and then characterized using scanning electron microscopy (SEM). Specifially, samples from irradiated U–7Mo dispersion fuel elements with pure Al, Al–2Si and AA4043 (~4.5 wt.%Si) matrices were SEM characterized using polished samples and samples that were prepared with a focused ion beam (FIB).

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Advances in nanotechnology over the past decade have made scanning electron microscopy (SEM) an indispensable and powerful tool for analyzing and constructing new nanomaterials. Development of nanomaterials requires advanced techniques and skills to attain higher quality images, understand nanostructures, and improve synthesis strategies. A number of advancements in SEM such as field emission guns, electron back scatter detection (EBSD), and X-ray element mapping have improved nanomaterials analysis.

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