Thermal diffusivity measurements

We report a facile process to fabricate cuprous thin films by thermal oxidation of copper substrates. Structure and phase identification were studied by X-ray diffraction measurement and Raman spectroscopy. Scanning electron microscopy was utilized to study surface morphology of the as-fabricated thin films and optical properties of the samples were investigated by diffused reflectance spectroscopy.

6p tamynhan6 14-09-2020 24 2   Download

A simplified procedure of lock-in thermography was developed and applied for characterization of nuclear materials. The possibility of thickness and thermal diffusivity measurements with the accuracy better than 90% was demonstrated with different metals and Zircaloy-4 claddings.

5p christabelhuynh 30-05-2020 8 2   Download