Elemental, structural and optical properties of nanocrystalline Zn1-xCuxSe films deposited by close spaced sublimation technique

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Results of this investigation have been correlated with the films structural and optical properties. Among the structural properties, surface roughness and morphology, and crystalline quality of the films have been obtained by using the XRD and AFM methods. Additionally, optical properties such as band gap tune-ability and dielectric constant have been determined by spectroscopic ellipsometer.

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