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CuAlS2 thin films - Dip coating deposition and characterization

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CuAlS2 thin films were deposited by a dip coating technique at room temperature. The X-ray energy dispersive (EDAX) and X-ray diffraction (XRD) analysis showed that the deposited CuAlS2 thin film is nearly stoichiometric and possesses a tetragonal unit cell structure.

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Nội dung Text: CuAlS2 thin films - Dip coating deposition and characterization

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